Signal Analyzers for Tektronix TDS 7000 Series Oscilloscopes – Obsolete

  • Guzik Hardware Accelerator Card for real-time signal analysis and data processing
  • Comprehensive Packages for Disk Drive Analysis, Jitter and Eye Diagram Analysis
  • Convenient and intuitive Windows-based User Interface optimized for touch-screen applications

Jitter and Eye Diagram Analysis Package

The Jitter and Eye Diagram Analysis package delivers wide set of timing measurements, including measurements of signal period jitter, pulse width jitter, rise/fall times, time interval errors and skew/setup/hold times.
It supports different measurement result representations like eye diagram, histogram, jitter track/trend, jitter spectrum, and unique eye diagram slicing mode with the ability to select the signal area of interest directly on the eye diagram for further measurements (see Fig. 1).
The jitter measurement solution from Guzik Technical provides outstanding measurement accuracy of < 1ps RMS on TDS7404 oscilloscope.

  • Comprehensive set of measurement including period, pulse width, rise/fall times, time interval error, skew/setup/hold times
  • < 1 ps RMS measurement accuracy with Tektronix TDS7404 oscilloscope
  • Eye diagram, histogram, track/trend, and spectrum representation of results
  • Unique eye diagram hardware zoom capability for increasing resolution
  • Digital Phased Lock Loop (PLL) with programmable bandwidth and digital clock recovery for precise time interval error measurements

Fig. 1. Jitter Histogram of Selected Part of Eye Diagram
(2.2ps RMS Jitter Measured)

Disk Drive Analysis Package

The industry leader in disk drive and magnetic head testing equipment, Guzik Technical Enterprises applied its extensive expertise to develop the comprehensive oscilloscope-based disk drive testing solution.
The Disk Drive Analysis package delivers wide range of industry standard measurements including Parametric, NLTS, SNR and Pulse Profile. It integrates a Digital PRML Channel with PR4, EPR4, E2PR4, and variable target PRML modes. It includes the extensive array of fully programmable digital filters/equalizers, digital clock and gain recovery with programmable bandwidth and customizable Viterbi decoder.
Disk Drive Analysis application provides automatic optimization of Digital PRML Channel, auto-setup of many software parameters, disk drive and oscilloscope triggers, measurement gating and much more.

  • 8Gbit/s PRML channel analysis with Tektronix TDS7404 oscilloscope
  • Digital PRML with PR4, EPR4, E2PR4, and Variable Target modes with automatic target optimization
  • Industry-standard Disk Drive measurements including Parametric (TAA, PW, Asymmetry), NLTS, SNR and Pulse Profile
  • Wide range of programmable digital filters
  • Disk drive specific triggers and gating

Integration with Guzik Testers
The Disk Drive Analysis package provides integration with Guzik WITE32 software and can be used with Guzik RWA-2585 and RWA-2000 series. For example, the track profile measurement with error rate curve can be performed by Disk Drive package by analyzing the read data from a Guzik spinstand (see Fig. 2).

Fig. 2. Track Profile with Error Rate (Bathtub Curve)
(1Gbit/s Data Rate, Error Rate Better than 10-6)

 

Disk Drive Analysis Package Features

  • Guzik Hardware Accelerator Card integrated with Tektronix oscilloscope provides real-time signal analysis and data processing
  • 8Gbits/sec complete PRML channel analysis with Tektronix TDS7404
  • Digital PRML with PR4, EPR4, E2PR4 and custom Variable Target modes with automatic PRML channel optimization
  • Digital PRML measurements including Bit Error Rate, SAM, Sample Values Distribution
  • Industry-standard Disk Drive measurements including Parametric (TAA, PW, Asymmetry), NLTS, SNR
  • Unique Pulse Profile Parametric measurements with high noise immunity
  • Wide range of programmable digital filters including low-pass and high-pass IIR filters and 32-tap FIR equalizer
  • Drive-specific triggers and gating simplify and speed up your work
  • Convenient and intuitive Windows-based User Interface optimized for touch-screen applications
  • Integration with Guzik RWAs and Spinstands

Applications:

  • Characterization of PRML channels in data storage and telecommunications
  • Characterization and testing of magnetic heads and disk drives
  • IDEMA measurements including TAA, PW50, SNR, Resolution and Asymmetry

Maximum Performance
Disk Drive Analysis package from Guzik Technical Enterprises delivers fast disk drive measurements on digital oscilloscopes. The package includes the Guzik Hardware Accelerator card and Guzik software environment installed on the Tektronix oscilloscope.
The 4 GHz analog bandwidth combined with 20 GSamples/sec sampling rate of Tektronix TDS7404 oscilloscope makes possible to perform PRML channel analysis up to 8Gbit/sec.
The unique design and strategic location of Guzik Hardware Accelerator card gives possibility to perform most time-critical measurements by hardware and in real-time with the speed of the oscilloscope acquisition.
Highly optimized Guzik graphical engine is capable to display large amounts of graphical data without slowing down the system.

Versatility
The Disk Drive Analysis package delivers wide range of disk drive oriented measurements including Parametric, NLTS, SNR and Pulse Profile. It integrates a highly flexible Digital PRML Channel with PR4, EPR4, E2PR4, and variable target PRML modes. The heart of the PRML channel is the digital clock and gain recovery with programmable bandwidth and customizable Viterbi decoder. The PRML channel also includes a wide range of programmable digital filters like low-pass and high-pass IIR filters and 32-tap FIR equalizer.
Disk Drive Analysis application provides semi-automatic optimization of Digital PRML Channel, auto-setup of product parameters, disk drive specific oscilloscope triggers and measurement gating.


Fig.1. Sample Values Plot, EPR4


Fig. 2. PRML Channel Optimization,
(Pulse Profile Capture and Reshaping)


Fig. 3. Sample Values Distribution Plot, EPR4

PRML Measurements
The Disk Drive Analysis package supports the wide range of PRML measurements and PRML channel performance evaluation tools:

  • Semi-automatic PRML channel optimization procedure, which includes the isolated pulse shape capture, pulse reshaping and equalizer adjustment (see Fig. 2).
  • Sample Values plot to display PRML samples at the output of the clock recovery over the time (see Fig.1).
  • Sample Values Distribution plot with MSE calculation to display the synchronized histograms of PRML samples (see Fig.3).
  • Comparator Error plot with BER calculation to display recovered user data along with reference data in NRZ format.
  • SAM Data plot to display Viterbi metric margins over the time.
  • SAM Histogram plot to display the histogram of Viterbi margins.
  • SAM Plot with SAM BER calculation to display the margins distribution.
  • TAA and Error Rate Track Profile (Bathtub Curve). Guzik RWA and spinstand is required for this test.

Easy to Use
The Disk Drive Analysis package provides intuitive Windows-based GUI optimized for oscilloscope touch-screen. For added convenience it supports second external monitor and front-panel oscilloscope knobs.

Digital Oscilloscopes Supported

Oscilloscope Model Platform
Guzik DSP Hardware
Accelerator
Oscilloscope Sampling
Rate
Tektronix TDS7104
10GS/sec
Tektronix TDS7154
20GS/sec
Tektronix TDS7254
20GS/sec
Tektronix TDS7404
20GS/sec


Specifications

PRML Max Bit Rate TDS7104: 2Gbit/sec
TDS7154: 3Gbit/sec
TDS7254: 5Gbit/sec
TDS7404: 8Gbit/sec
Acquisition Length Up to 32 MSamples*
PRML Modes Variable Target, PR4, EPR4, E2PR4
PRML Measurements Sample Values Plot,
Sample Values Distribution Plot, MSE,
Comparator Error Plot, Bit Error Rate (BER),
SAM Data Plot, SAM Histogram Plot, SAM BER
PRML Channel Optimization Automatic and semiautomatic based on signal quality monitor
Parametric Measurements TAA, TAA+, TAA-, TAA Asymmetry, TAA Resolution,
PW, PW+, PW-, PW Asymmetry, RMS
SNR Measurements Autocorrelation SNR,
TAA/RMS (Guzik) SNR,
RMS/RMS SNR
NLTS Measurements NLTS Dipulse Extraction,
NLTS Autocorrelation
Pulse Profile Noise suppression up to 15dB SNR
Repetitive patterns required
Track Profile Combined TAA profile and Error Rate profile
(Guzik RWA and Spinstand required)
Acquisition Trigger Manual,
Sector,
Read Gate,
Custom modes
Measurement Gating Manual,
By oscilloscope cursors,
By external Read Gate
Parametric Measurements Accuracy (For Repetitive Patterns)
TAA ± 0.5% (down to 15dB SNR)
PW ± 1.0% (down to 15dB SNR)
Guzik SNR ± 0.2dB (down to 15dB SNR)
TAA Resolution ± 3.0%

* Limited only by oscilloscope’s available record length and current channel configuration, up to 32MSamples on Tektronix TDS7404.

Jitter and Eye Diagram Analysis Package Features

  • Guzik Hardware Accelerator Card integrated with Tektronix oscilloscope provides fast signal analysis and data processing
  • Measurement accuracy down to 1 psec RMS (with TDS7404 oscilloscope), which does not depend from oscilloscope trigger jitter
  • Measurement of all main timing parameters of signals: period, pulse width, rise/fall times, time interval error (TIE), skew/setup/hold times
  • Representation of all measured parameters in various graphical forms (histogram, track, trend, frequency domain) and in form of accumulated statistical results
  • Eye diagram form of signal representation with powerful hardware zoom feature
  • Internal clock recovery based on digital PLL with programmable bandwidth
  • Capability of measurements at any distance and duration from user-defined reference event
  • Jitter measurement of single input signal or channel-to-channel
  • All measurements can be done using one acquisition or multiple acquisitions
  • Comprehensive autoset feature simplifies product configuration
  • Convenient and intuitive Windows-based User Interface optimized for touch-screen applications
Applications:

Digital circuits design:

  • Measurement of timing margins
  • Characterization of clock distribution circuits
  • PLL-synthesized (including spread-spectrum modulated) clocks testing
  • Jitter sources investigation

Telecommunication:

  • Characterization of both electrical and optical encoded data streams
  • Analysis of phase and frequency modulation (PM, FM) and keying (PSK, FSK, MSK)
Maximum Performance
The Jitter and Eye Diagram Analysis package from Guzik Technical Enterprises delivers wide range of fast and accurate measurements of different timing parameters on digital oscilloscopes. The package includes the Guzik Hardware Accelerator card and Guzik software environment installed on the Tektronix oscilloscope.
The 4 GHz analog bandwidth and 20 GSamples/sec sampling rate of Tektronix TDS7404 oscilloscope combined with sophisticated signal processing algorithms make possible to obtain measurement accuracy down to 1 psec RMS. The unique design and strategic location of Guzik Hardware Accelerator card gives possibility to perform most computation-consuming measurements by hardware, thus delivering high speed of operation.


Fig. 1. Jitter Histogram of Selected Part of Eye Diagram
(2.2ps RMS Jitter Measured)


Fig. 2. Jitter Track of TIE


Fig. 3. Spectrum of Jitter Track of TIE

Better by Design
The following principles underlie the Jitter and Eye Diagram Analysis package:

  • All measurements are based on time positions of signal edges. Sophisticated and precise algorithms are used for edge detection
  • All valid edges in the acquisition are included in the measurement
  • Possibility to apply any representation of result to any measured parameter
  • Possibility to define custom timing parameters to be measured while preserving measurement technique (user-defined measurements)
  • Full choice of source signals for measurements
  • Preserving accuracy of graphical representation forms when zooming

The following benefits are resulted from the implementation of these principles:

  • High precision of measurements including user-defined measurements
  • Independence from oscilloscope trigger jitter
  • Possibility to obtain all results (including eye diagram and statistics) from one acquisition or accumulate them from multiple acquisitions
  • Variety of possible representation forms for each measured parameter
  • Flexibility in choosing external or internal reference signals in relative measurements (for example external clock or clock from internal clock recovery with adjustable bandwidth)
  • Hardware zoom feature preserves the quality of the eye diagram at any zoom ratio

Easy to Use
The Jitter and Eye Diagram Analysis package provides intuitive Windows-based GUI optimized for oscilloscope touch-screen. For added convenience it supports second external monitor and front-panel oscilloscope knobs.
The package has comprehensive autoset feature for automatic adjustment of different measurement parameters. It significantly simplifies the product configuration and minimizes the learning time.

Digital Oscilloscopes Supported

Oscilloscope Model
Platform
Guzik Hardware Accelerator
Oscilloscope Sampling Rate
Tektronix TDS7104
10GS/sec
Tektronix TDS7154
20GS/sec
Tektronix TDS7254
20GS/sec
Tektronix TDS7404
20GS/sec

Specifications

Measured parameters Period,
Pulse width,
Rise/fall time,
Phase error (Time interval error, TIE),
Skew/setup/hold time,
Complex user-defined relative time positions (slice mode)
Results representation forms Eye diagram,
Histogram,
Track,
Trend,
Spectrum of Track/Trend,
Statistics,
Average trace
Accumulation modes Off (one acquisition),
Limited population,
Unlimited population
Timing measurement accuracy (at 20 GS/s) Down to 1 psec RMS, independent from oscilloscope trigger jitter
Interpolated resolution in timing measurements (at 20 GS/s) 500 fsec min
Resolution bandwidth in spectral measurements (at 20 GS/s) 1 kHz min
Acquisition length 32Msamples* max
Digital clock recovery modes(based on digital PLL)
Clock in – clock out: Synchronized by clock, outputs recovered clock
Data in – clock out: Synchronized by data, outputs recovered clock
Data in – data out: Synchronized by data, outputs data re-clocked on recovered clock
Digital PLL bandwidth Programmable (including 0 Hz – ideal reference)
Number of bins in histogram 1024 max
Trigger for eye diagram Designated edge of main or reference signal
Reference signal in relative measurements Main or reference scope channel, PLL-recovered main or reference channel (digital clock recovery output)
Available autosets Edge detectors levels and hysteresis,
All time spans for all result representation forms,
Digital clock recovery parameters
Processing Speed Up to 33 MSamples/sec (limited by oscilloscope throughput)

* Limited only by oscilloscope’s available record length and current channel configuration