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Software

Besides the primary WITE32 Test Environment package at the heart of our spinstand-based test systems, Guzik offers a variety of software options to provide additional measurement accuracy and analysis. Control and Automation software enhances various electro-mechanical capabilities of the test system (such as servo accuracy), and the available suite of Analysis software tools provides deep insight into the drive component under evaluation. Adjacent Track Interference, 3D Pulse Profile, Media Scanning and Bit Error Rate are examples of some of the optional additions. Some software tools require the WDM5000 Waveform Digitizer to be part of the overall test system.

WITE32

WITE32

WITE32 is the latest Guzik software package for Read/Write Analyzer (RWA) control. The open design architecture of the package provides flexibility and expendability to both user and designer. WITE32 is developed under Microsoft Windows 32-bit environment…

WITE32 Developer’s Kit (WDK32)

WITE32 Developer’s Kit (WDK32)

The WDK Version 3.02 is released to work with WITE32 Version 3.02 (or later) Note:  Guzik Technical Enterprises reserves the right to change the functionality of both the WITE32 software and the WITE32 Developer’s Kit (WDK) software at any time, thereby requiring you to upgrade both WITE32 and the WDK to the new release, to

Servo Improvement Package

Servo Improvement Package

With today’s high track densities, using embedded servo to provide accurate and repeatable positioning is a requirement. Guzik V2002 now supports two modes of servo operation:
• Standard Servo Mode (included in WITE32)
• New Servo Mode (optional, included in the Servo Improvement package)

WDK Script: Microsoft Excel-Based Scripting For WITE32

WDK Script: Microsoft Excel-Based Scripting For WITE32

The new script version of Guzik WITE32 Development Kit (WDK32) allows for interactive execution of all Guzik WDK32 functions including RWA and spinstand control functions, measurement functions, and operations.

Parametric TFC Control

Parametric TFC Control

Dynamic adjustment of write-mode TFC power, depending on four parameters: Write current Write current overshoot amplitude Write current overshoot duration Write signal frequency Works transparently with WITE32, Guzik test modules, and WDK-based custom modules Calculates write signal frequency depending on a data pattern, not just write clock

Sector Measurements Test Module

Sector Measurements Test Module

Most of WITE32 standard measurements with per-sector results Capability to sweep/vary most of WITE32 system parameters Integrated graphical result display Capability to export all raw test results to a text file

Perpendicular Recording Test Package For WITE32

Perpendicular Recording Test Package For WITE32

Amplitude Asymmetry Test Differentiator Optimization Test Rise-and-fall Time (T50) Test Rolloff Test Saturation Asymmetry Test

Write-Excited Sectored Amplitude (WESA) Test Package

Write-Excited Sectored Amplitude (WESA) Test Package

The Write-Excited Sectored Amplitude (WESA) test package is a new WITE32 external module. The module implements a set of tests that analyze different physical aspects of how a write operation can affect a subsequent read operation.

Bit Error Rate (BER) Module for WITE32

Bit Error Rate (BER) Module for WITE32

The BER Module is designed to provide various tests based on Bit Error Rate (BER) measurement using PRML channel.

Digital Frequency Domain Analysis with D5000 Signal Analyzer Software

Digital Frequency Domain Analysis with D5000 Signal Analyzer Software

D5000 Signal Analyzer Software allows for performing spectrum analysis much faster and in a wider frequency range comparing to standard SA-960 spectrum analyzer of RWA-2000 series.

Media Scanning Package (MSCAN)

Media Scanning Package (MSCAN)

The Media-Scanning Package (MSCAN) detects a variety of defects on media. It also provides a software environment to develop new media-scanning and defect-reporting modules. Such modules can be created for PRML Channel, Read-Write Analyzer (RWA), or custom-designed hardware.

D5000 MSCAN ETA Erased Track Thermal Asperity and Extra Pulse Scanner

D5000 MSCAN ETA Erased Track Thermal Asperity and Extra Pulse Scanner

Thermal Asperity and Extra Pulse detection on erased track Multi-threshold amplitude analysis of positive and negative signal peaks 10 detectors can run in parallel with different settings/thresholds Digital low-pass filtering with programmable cut-off frequency High 15-bit resolution of detection thresholds  

D5000 Digital Media Scanning

D5000 Digital Media Scanning

Transition time shift (bit shift) and amplitude analysis Various defect detectors for simultaneous analysis of bit shift, missing pulses, super pulses, and thermal asperities Multi-threshold amplitude analysis at positive and negative signal peaks 24 detectors can run in parallel with different settings/thresholds Time shift (bit shift) analysis by zero-crossing detection for perpendicular recording High sampling

3D Pulse Profile Test for Nano-Scale Magnetic Field Imaging

3D Pulse Profile Test for Nano-Scale Magnetic Field Imaging

Build 3D and 2D Plots of Individual Magnetic Transitions Along-the-track Sampling Period 0.1ns (2nm at 7200RPM, MD location)* Cross-track Accuracy 0.4nm (1 s) with Guzik Servo** Non-destructive Measurements Scan Time less than 20 Seconds for 10mm ´ 10mm Area with 12 nm Step Compatible with Perpendicular and Longitudinal Products ________________ * All specifications are subject to change.

Micro Actuator Tests for V2002 Spinstands

Micro Actuator Tests for V2002 Spinstands

Micro Actuator is a device located on the suspension of a magnetic head
that can transform applied voltage to radial displacement of the head.

Improved Adjacent Track Interference Test (WATI 2)

Improved Adjacent Track Interference Test (WATI 2)

Faster Test Execution Less Number of Retry Operations More Successfully Written Sectors TAA Measurement SNR Measurement BER Measurement  

Adjacent Track Interference Multi-Track Test (WATI MT)

Adjacent Track Interference Multi-Track Test (WATI MT)

Multiple Side Tracks Configurable by User TAA Measurements SpiSNR Measurements

New WITE32 Immediate Start Mode for Shorter Test Time

New WITE32 Immediate Start Mode for Shorter Test Time

The new mode of Guzik Test System operation allows for performing tests approximately 20–30% faster. This is an optional purchase component of WITE32, which requires a license.