Introduction

This document contains the release notes for WITE revision 1.45 from Guzik Technical Enterprises.

All discussion in this document uses WITE version 1.44 as a baseline for comparison. For information about features and modifications prior to 1.44, please refer to the WITE user’s manual and to the release notes for previous revisions of WITE.

New features in WITE 1.45

The S312MP-CF and S1701-CF spinstands are supported. These new Guzik spinstands are controlled by a Motorola ColdFire microprocessor rather than the 68000 microprocessor used in previous models. The CF models possess the following new features and advantages:

• The speed of communication with the host computer has been increased.
• Internal overhead has been reduced for all spinstand operations.
• DSP control for the linear, rotary (S1701-CF) and spindle motors and the piezo actuator.
• S-curve profiles for linear and rotary motions.
• Simultaneous linear and rotary movements, decreasing test time and simulating the real drive conditions for heads during seek track operations (S1701-CF only).

The alternate spectral elimination test was modified for use in production to allow the input of a precompensation range and output only the minimum NLTS value over that range along with the corresponding precompensation and bit period rather than the entire range of data

Bugs Fixed in WITE 1.45

The alternate spectral elimination test would not allow bit periods smaller then 6.25ns. In version 1.45 the minimum is the correct value of 3.125ns.

When included in a production sequence, the alternate spectral elimination test produced the spurious error message "Table data output to DataBase is impossible in production." This message does not appear in WITE 1.45.

The PRND730D pattern needed for the Pseudorandom NLTS test was missing in version 1.44. WITE 1.45 includes this pattern in the NLTS.EPT pattern file.

Known bugs in WITE 1.45

Some bugs were found too late to be fixed for the 1.45 release and will be fixed in a later release. This section contains all known bugs that you are likely to encounter. A bug’s presence here means that we are aware of the problem and actively working to solve it. If you encounter a problem not on this list, please report it to Guzik customer support.

If the track profile test is used with the "use fast offset" option enabled and more then one iteration specified, one or more points may fall below the real TAA value. If you need more than one iteration, do not use the "use fast offset" option.

The "retest with next setup" option in the "Production | Grd/Norm" menu does not register results to the database after the first setup. It should not be used.

Some DOS applications interfere with communication with Guzik hardware and can result in unstable test results. Please exit all DOS applications before running WITE.