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Release Notes
WITE32TM

Version 2.20

05/12/99

Introduction

The 2.20 release introduces new features and fixes bugs found in the WITE32 2.14 release. (This document uses the WITE32 2.14 revision as a base line for comparison.)

New Features

WITE32 Results Processor Engine

The new Result Processor is introduced. The main feature of the new Result Processor is that the intermediate results are kept in the memory. The file RWARSLT.MDB is no longer used and it is kept for compatibility purposes.

New WITE32 PRML Chip Standard - M16

Support for M16 PRML read channel is the new standard in the WITE32 2.20.

Two WITE32 Tests Moved to the PRML Module

The following two tests are moved to the WPRML module:
    • "Partial Histograms" test
    • "Guzik PRML Channel Optimization" (CHANOPT)

New WITE32 Defaults

The following default values have changed in this release of WITE32:
    • Default preamble length for all parametric patterns (HF,FF,LF,IS etc.) is changed from 40¼S to 20¼S. However the previously created patterns retain the 40¼S preamble until recompiled.
    • The default pattern in the "Automatic Equalization" (AutoEqu) test is RCKRND.
    • WITE default parameters (in a newly created product) are changed to be more suitable for the modern state of magnetic drive industry. The previous set of default parameters sometimes did not provide the optimal performance of the system.
    • Default WriteFlux value on the Dashboard is 20Mflux
    • Default Control | Clock value is 50Mflux
    • Default TrackProfile test range is –100..+100¼In, step 2 ¼In
    • Default Write/Read Offest test range is –100..+100¼In, step 2 ¼In
    • Default ReadBias current value is 6mA
    • Default Configure | TestOption | RWOffset is enabled
    • Default Configure | TestOption | Average and Deviation statistics is enabled
    • Default Production test has one track enabled.

New WITE32 Warning Message

A new warning message appears when filters are changed in the analog box.

New, But Reserved for Future Use

The following new fields are disabled, and reserved for future use:
    • The following "Servo"-related controls are visible in certain WITE32 dialogues, but they are always disabled in the WITE32 2.20. The options are reserved for future use on the versions of the RWA-2550 series equipped with the "Servo" capability.
    • "Servo Erase" and "Write Servo" buttons on the system dashboard.
    • "Servo Erase before test", "Write Servo before test" checkboxes and "Servo Control" radio-button in the production test configuration.
    • "Enhanced Performance" option in the Configure | Test Options dialogue is displayed but not available in the WITE32 2.20. The option is reserved for future use on the next versions of the RWA2550 series.

Fixed Bugs

The Major Fixed Bugs

The following bugs have been fixed:
    • "Best Fit Window" in the TripleTrack test does not work.
    • TripleTrack test does not work in multi-zone production test.
    • "Normalization" option in the TripleTrack test produces incorrect plot.
    • If a PRML pattern is selected and "Restart" button is pressed the error message "Clock Recovery loose sync" shows up.
    • If no BitShift Analyzer is present in RWA2550 then the error message "AM not found" appears during read operation with HF,LF or any other parametric pattern.
    • Error "Object not valid or no longer set" after double click on Abort button in WROffset test.
    • The warning "TAA recalibration for head 1 is needed" appears despite the head 1 is disabled.
    • "Overflow" message in Saturation test if write current is greater than 50.
    • "Spinstand command" control in Configure–>Device window always returns value "1" instead of the actual result.
    • Track format changes like RPM increase, sector number change can cause negative read/write gates in the Control | Gate and it results in the error messages "Program relation is too complex" showing up.
    • The limit of 3100 points in the Spectrum Analyzer test is removed.
    • The Spectral SNR test gives the error message "Can't find PTNGETPRD".
    • Error "PCTRD pattern cannot be selected" appears during WITE startup if the default pattern in the first Zone/Setup was PCTRD.
    • Timing Asymmetry test reports wrong results for small read gate if "Write" option is enabled in the setup of the test.
    • After switching heads in WITE dashboard the R/W offset is reset to 0 (Write position).
    • Most of PRML chip adapters can work only with "old style" .PDL/.EPT patterns, so that after selection these patterns for RWA2550 the warring message "…Old style pattern…." shows up.
    • If Control | Quick Charge value is "Auto" then after the first start it changes to "Off" by itself.
    • The error message "Incorrect context tag" appears during Automatic Equalization.
    • The "Copy" command in the Product Selection dialogue fails. That causes a blank product to be left in the list box and WITE crashes.
    • While performing the "Calibrate All" procedure on RWA2550 the error message "Cannot find test: Calib Bitshift" shows up.
    • User defined zone sequence in production is ignored.
    • After a record is deleted from Normalization's Record table, the "Delete" button is messed up.
    • Test does not show up when selected on an empty test sequence during production test configuration.
    • No warning to the user to save configuration although user has made changes in the following:
    • check/uncheck Configure|Test Status Bar
    • check/uncheck Configure|Runtime Display
    • check/uncheck Configure|Operator Panel Startup
    • Change parameters in Configure|Configure Result Processor
    • No multi-zone data edit dialogue is available in the Popcorn test and ChanOpt test.
    • Popcorn test does not take into account the Write/Read Offset value, it counts the pulses at the 0 offset (Write position) instead.
    • Write/Read Offset is ignored in the Sector Amplitude Stability (SAA) test, it measures the amplitude at the 0 offset (Write position) instead.
    • If the BitShift Analyzer is not in the system then the parameter "Window" in Control | System menu is not disabled.
    • The Pulse Stability test gives the error: "Wite98> RWA Message: AdcPrfBuild: 12 points do not fit in 10 points buffer" on RWA-1632.
    • If none of the tests is checked in the Saturation test, a "Division by zero" error message shows up.
    • WGMA "MultiTrack Critical Erase Current" test plot does not reset legends after closing the plot window.
    • The upper Write current limit is hard-coded to 50 mA in the "NLTS vs. Write Current" test.
    • Write Flux operations causes wrong Write Gate setting if the Write Gate is specified in bytes. In addition to that if the Read Gate is specified in percent and the sector size is too small then the error message "Not a valid value" shows up.
    • All 747 test configuration dialogue boxes, all WGMA test configuration dialogue boxes and Triple-Track test configuration dialogue box will not close upon pressing "Close Windows."
    • During the initial WITE loading the Configure Components information window blanks out if there is an error message.
    • Encoder Bypass feature (in the M16 PRML chip ) does not work .
    • M16 PRML chip screen cannot be printed by using Ctrl-P shortcut.
    • Write/Read offset test setup screen cannot be printed by using Ctrl-P shortcut.
    • Alternative Spectral Elimination test shows duplicate setups (i.e. Setup 1, Setup 2, Setup 2, Setup 3, Setup 3 etc.)
    • WITE crashes while deleting a user-created Production Configuration.
    • If Bitshift option or Error Rate option is checked on in the TrackProfile test, then excessive configuration data items are reported in the result window, slowing down the result processing enormously.
    • Intermittent error: when running a custom external module test, the system sometimes hangs up with error message "1701CF ERROR 4005: SPN Timeout on command completion". This problem also occurs on the "NLTS vs. Precomp" test if it is configured to have many steps.
    • In several NLTS tests after pressing the Reset button in configuration dialogue some setup values become incorrect.
    • If a PRML channel chip pattern is selected, then the Control | System Write Source item displays the supporting module name instead of the chip name.
    • Offtrack Performance test does not work with the M16 PRML channel: the subsequent runs of the test produce flat BathTub curve.
    • ‘Protected reference’ option in the Product Selection dialogue does not work.

Fixed Bugs Resulting in Changes to the User Interface

The following bugs have been fixed, and their fix has resulted in a change to the user interface:
    • The Range and Step edit boxes in the Write/Read Offset test setup are too narrow for format used for these values.
    • "Extra pulses" parameter in the Popcorn test does not fit into the text box.
    • The tab order for the dialogue box for entering new Production Configuration is wrong.
    • A zone-setup editing table for Boolean parameters displays the initial values in "True/False" form, but after editing it displays them in "Enable/Disable" form.

Known Bugs

GTE is actively working to solve known bugs. If you encounter a problem not on this list, please report it to Guzik customer support.
    • Control | ScopePoint Scope Point 4 is not displayed in Edit Mode.
    • While running Production Standard test the error message "No current record" shows up if "Grading" or "Normalization" was turned on.
    • If a user deletes the last and the second from the last Normalization record, then WITE enters into a long loop of meaningless error messages like "Object ~~ Method ~~ has failed".
    • NLTS tests can not go higher than 415Mflux (2.4 bit period) on RWA2550.
 
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