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WITE32™

Version 2.41

12/21/1999

Introduction
Modifications


1. New PCI Guzik Host Adapter support
2. New option in the Universal Preamp Configure dialogue box
3. The Triple Track test band erase improved
4. Hard sector mode availability check
5. New warning in sector mode
6. Write Option in the Write/Read Offset test improved
7. Default threshold value for the Write/Read Offset test changed
8. New option in the Servo Calibration dialogue box
9. S-1701CF spinstand positioning accuracy improved
10. New result processor configuration option
11. WITE32 interface to external OCR system

Fixed Bugs
Notes

Problems with a Track Format setup in WITE32 ver. 2.35

Known Bugs

 

Introduction

The 2.41 release incorporates new features introduced after the WITE32 2.40 release. (This document uses the WITE32 2.40 release notes as a base line for comparison.)

Modifications

  1. New PCI Guzik Host Adapter support

    New PCI Guzik Host Adapter (P/N 310360) is supported in WITE32 ver. 2.41.

  2. New option in the Universal Preamp Configure dialogue box

    The Individual head amplifier power control option was added to the Universal Preamp Configure dialogue box. This option is available for Guzik Universal Interface 7 SP, Assy. Rev. 'E' and above.

     

    When the Individual head amplifier power control option is enabled, the power is provided to one of the head amplifiers only. Power is provided to the amplifier, which is selected in the Head selection frame of the Engineering mode dashboard or currently under test in the Production mode.

    When the Individual head amplifier power control option is disabled, both head amplifiers are powered simultaneously.

  3. The Triple Track test band erase improved

    The Triple Track test now has wider range of band erase. The range for band erase is taken from the From and To setup parameters in the Track Profile Range frame, but it is at least seven tracks in both directions. Mentioned frame is a part of the Track Profile Configure dialogue box. Track size for band erase is calculated as the TrackSize/3, where TrackSize is a Device Configuration parameter.

    In previous versions of WITE32 the band erase operation erased six tracks in both directions regardless of the Track Profile Range settings.

  4. Hard sector mode availability check
  5. The sector Mode drop-down menu in the Gate and Track Format dialogue box now prevents user to set sector mode, which is not supported by spinstand/device connected. The following table lists sector modes available for different spinstand/devices:

    Spinstand / device connected

    Sector Mode setting

    None

    Soft

    Positive

    Negative

    Guzik spinstand with servo option

    +

    +

    +

    -

    Guzik spinstand without servo option

    +

    +

    -

    -

    IMAN driver

    +

    +

    +

    +

    Third-party spinstand / hard drive

    +

    +

    +

    +

    If you already have a product, created in previous versions of WITE32, and this product contains wrong sector mode setting, you will get one of the following warning messages on WITE32 startup:

    Positive Sector Mode is not supported by the currently selected device. Soft Sector Mode is used instead. Modify the Sector Mode setting in the Gate and Track Format dialogue box.

     

    Negative Sector Mode is not supported by the currently selected device. Soft Sector Mode is used instead. Modify the Sector Mode setting in the Gate and Track Format dialogue box.

  6. New warning in sector mode

    In any sector mode (Soft, Positive or Negative) WITE32 displays a warning if all sectors are disabled:

    WITE detected that all sectors are disabled in sector mode.

    It may cause unpredictable results and errors.

    Please, select either non-sector mode or enable some sectors

    in the Control | Gate and Track Format dialogue box

  7. Write Option in the Write/Read Offset test improved.

The new Write Option frame in the Write/Read Offset test configuration dialogue box contains the following controls:

  • The Enable Write checkbox. When this option is enabled, the Write/Read Offset test writes signal before running each iteration. When this option is disabled, the test does not write signal.
  • The Pattern / Flux radiobutton. When this radiobutton is set to Pattern, the test writes Pattern specified in the Pattern selection drop-down menu before running each iteration. When this radiobutton is set to Flux, the test writes Flux specified in the Flux textbox.
  • The Pattern selection drop-down menu. You select the pattern for the write pattern option in this drop-down menu.
  • The Flux textbox. You specify the flux frequency for the write flux option in this textbox.
  1. Default threshold value for the Write/Read Offset test changed

    The default value for the Amplitude Threshold for Track Center Calculation setting in the Write/Read Offset test configuration dialogue box has been changed to 95%. The default value is used only when you create new product.

    In previous versions of WITE32 the default value was set to 100%.

  2. New option in the Servo Calibration dialogue box

The new Apply Results to frame in the Servo Calibration dialogue box allows you to apply results of servo calibration only to current Zone/Setup or apply them to multiple Zone/Setups. You can select between the following options:

  • Apply results to the Setup in the Current Zone
  • Apply results to All Setups in the Current Zone
  • Apply results to All Setups in all Zones
  1. S-1701CF spinstand positioning accuracy improved

    S-1701CF spinstand driver (1701CF.S) has been modified to ensure better accuracy and stability of the micropositioning system. The modifications are done in order to eliminate instability of the Overwrite test results for heads with a small track width.

    Please note, that the spinstand DSP controller board revision must be 'T' and above. For older boards the enhanced micropositioning accuracy and stability feature will not be enabled. You can check the DSP controller board revision from WITE32. To do that, you open the Configure | Device | Run Alignment Program. | Parameters | Spinstand Parameters. dialogue box in the spinstand Factory Settings mode and check the DSP control. Board rev. field.

  2. New result processor configuration option

    The Fast Output for Production Test option is introduced in the Configure | Configure Result Processor ... dialogue box. If enabled, this option forces results to be exported into the specified ASCII file, directly from the result stream, bypassing the result screen layout. This option makes result exportation to ASCII file faster. The Fast Output for Production Test option applies only to the tests from the Production Tests group (i.e. the Production test, the Production Standards test e.t.c.). This option is effective in both Engineering Mode and the Production Mode.

  3. WITE32 interface to external OCR system

The capability to obtain the Head ID, HeadStack ID, Disk Pack ID by means of external, user supplied Optical Character Recognition system, is added to WITE32. In order to hook up an external OCR system you should do the following:

  1. Enable the flag External Source in the Production Head S/N setup.
  2. When Production test is started WITE32 waits until it can read the file SerNumOCRn.XCH in the WITE32 folder where n is the spinstand index. For system with single spinstand the file name is SerNumOCR1.XCH . The standard Head/HeadStack/Disk ID dialog is not displayed.
  3. The content of the file should be composed of the head and disk information in a form shown below:

    Head0=<Head 0 ID>

    Head1=<Head 1 ID>

    Head2=<Head 2 ID>

    . . .

    HeadStack=<Head stack ID>

    Disk=<Disk pack ID>

  4. As soon as the information is read, WITE32 issues a command to delete the file and the external OCR needs to write it again when the next head or head stack comes up.

Fixed Bugs

  1. The WITE32 Operator Panel is blinking when 1701MP or 312MP spinstand connected. The bug was introduced in revision 2.40.
  2. The "[PARS] Illegal symbol: serial_n" error message appears in the WITE32 Operator Panel when 1701MP or 312MP spinstand connected. The bug was introduced in revision 2.40.
  3. If the Write/Read Offset test fails to measure the Write/Read offset, it does not always output 9999 as an indicator of the failure.
  4. The Write/Read Offset test gives intermittent "Overflow" error message. The bug was introduced in revision 2.40.
  5. Register settings in the PRML chip configuration form have not been saved properly.
  6. Result processor bug: results are displayed on wrong columns, missing results on the window or blank result window.

Important note:

This bug caused wrong result layout to be saved in the product directory. WITE32 rev.2.41 will delete all result layouts you had in your products. Layouts will be deleted only once during product import. You need to restore your result layout settings manually after importing your product to WITE32 rev.2.41.

 

Notes

Problems with a Track Format setup in WITE32 ver. 2.35

Non-zone Track format and Sector table settings became zone-dependent settings in the rev. 2.40. Due to an error in the automatic conversion, products taken from the rev. 2.35 to the rev. 2.40 and above will have a Track format Sector Mode reset to None, all sectors disabled. If you have a product from rev. 2.35, which was working in the Sector mode, please go to the Control | Gate and Track Format. dialogue box and restore your original settings.

Please note, that if you never installed WITE32 ver.2.35 or you were never using sector mode, you would not have problems with Track Format settings.

Known Bugs

All the recurring known bugs are reported on our web site, www.Guzik.com. If you encounter a problem that is not on that list, please report it to Guzik customer support at Support@Guzik.com.

 
Copyright © 2003 Guzik Technical Enterprises. All rights reserved.