|
3. The Reset Setting and Save Result options became
mutually exclusive. The system will prevent you to select both options
simultaneously because it is logically incorrect.
4. Test setup data storage type has been changed. Custom database
engine has been eliminated and replaced by standard WITE-style engine
based on MS-Access database format. When you run the WITE32 ver. 2.50
first time with the product created using previous versions of WITE,
the software will ask you to perform automatic conversion of your
settings. If you press the Yes button, then the data will be
converted to new format. Otherwise you previous settings will be ignored
and default settings will be applied.
5. The new, improved reshaping algorithm was implemented in the Guzik
Channel Optimization test.
3. HEAD AMPLIFIERS
- The support for the following new head amplifiers is introduced
in WITE32 ver. 2.50:
- TLS26A833,
- VM5410 rev.D2,
- ThorOrca SSI,
- ThorOrca VTC,
- Romulus.
- GUZIK4 head amplifiers are now supported in new DLL-mode (using
UniversalHA.DLL driver). The old HDE-mode is also available (using
GTEMR4*.HDE drivers). New DLL-mode is preferred mode and engaged
automatically upon Wite32 start or restart. All properties and functions
of head amplifiers are the same in both modes.
- In the new DLL-mode the Installed information box in the
Control | HeadAmp dialogue box contains the "HA:" prefix
for head amplifiers or the "HS:" prefix for head stacks.
4. RCE32 MODULE (PRML READ CHANNEL EVALUATION 32 BIT)
RCE32 is an external WITE32 module designed for evaluation and optimization
of PRML read channels. This module is introduced in WITE32 ver. 2.50.
RCE32 has the following features:
- Optimization sequence graphical editor
- Single or multi-parameter scans
- Choice of parameters:
- Channel register
- Read Bias
- Write Current
- Analyzes chip behavior by observing:
- Channel Quality Monitor
- Channel Adaptive Registers
- Comparator Error Rate
- Looping Scan function
- Result tables for easy export to other programs
For more information see file \DOC\RCE32.HTM in the your WITE32 directory.
5. SPINSTANDS
Guzik spinstand drivers for S-311 and S-312 spinstand models are
excluded from WITE32 software. The latest WITE32 revision that supports
S-311 and S-312 models is WITE32 ver. 2.45. The WITE32 rev. 2.50 supports
the following Guzik spinstands:
- S-312MP,
- S-312MPCF,
- S-1701,
- S-1701CF,
- S-1701A.
- WDCP External Module
The Spinstand Alignment program (WDCP) has become a WITE32 external
module named WDCP Tests. Currently the WDCP Tests module includes
one test, the Balancing test.
To install the WDCP Tests module please do the following:
- run WITE32 in the Engineering mode.
- open the File | Select Modules… dialogue box,
- press the Install button,
- select WDCP.EXE file and press the Open button; the WDCP
Tests module will appear in the Available modules list,
- place cursor on the WDCP Tests module name in the Available
modules list and list of Selected modules.
After installation of the WDCP Tests module, the WDCP Tests group
appears under Tests menu. You can select the Balancing test and
assign it to the soft button in both WITE32 Engineering mode dashboard
and Operator Panel.
The Balancing test does not have a setup configuration form.
Please refer to the Balancing the Air Spindle manual for
details on how to perform balancing of your spinstand.
If WITE32 is
not running, the WDCP program can also run as a standalone application
the same way as it was in previous versions of WITE32.
6. CHANGES IN NORMALIZATION SYSTEM
Type of Normalization
You can now explicitly select the type of normalization for the
result of any test. In previous revisions of WITE32 the test itself
specified the type of normalization, which could not be changed.
Press the Type button in the Normalization System
dialogue box to configure the Normalization type of the results:
The Normalization System - Type of Normalization dialogue
box appears:
There are two columns:
- Result Name – the name of the result specified by the
test,
- Type – the type of normalization.
There are five possible selections for the type of normalization:
.
|
|
No normalization will be applied
|
|
|
Additive normalization
|
|
|
Multiplicative normalization
|
|
|
Linear normalization (a combination of addition and multiplication).
See the linear normalization algorithm details below.
|
|
|
The default normalization type for the selected test result.
Depending on the specific test result, the Test Defined normalization
can be NONE, ADD, MULT, or LINEAR.
|
.
Use the Close button to close the window.
Use the Save button to save your changes in configuration
storage.
Use the Reset button to retrieve the data from the configuration
storage and update the window.
Use the Reset to Test Defined button to choose the test defined
values for all result names.
LINEAR Normalization
The new type of normalization has been introduced in Normalization
server.
Example:
For a specific Head(Surface No.), Zone, Location the following TAA
results were received on Standard and Gold media.
.
|
|
Standard
|
Gold
|
|
Head S/N H000A
|
|
|
0.9012
|
0.8934
|
|
0.8968
|
0.8872
|
|
0.9023
|
0.8897
|
|
|
Average
|
0.9001
|
0.8901
|
|
Head S/N H000B
|
|
|
0.8534
|
0.8534
|
|
0.8338
|
0.8552
|
|
0.8397
|
0.8597
|
|
|
Average
|
0.8423
|
0.8561
|
|
Head S/N H000C
|
|
|
0.8634
|
0.8834
|
|
0.8738
|
0.8697
|
|
0.8797
|
0.8812
|
|
|
Average
|
0.8723
|
0.8781
|
|
Head S/N H000D
|
|
|
0.8524
|
0.8294
|
|
0.8537
|
0.8445
|
|
0.8601
|
0.8308
|
|
|
Average
|
0.8554
|
0.8349
|
|
Head S/N H000E
|
|
|
0.8798
|
0.8901
|
|
0.9283
|
0.9279
|
|
0.8922
|
0.8913
|
|
|
Average
|
0.9001
|
0.9031
|
.
The average result values for each Head S/N form
pairs:
.
|
|
Standard record, ResStd(I)
|
Gold Record, ResGold(I)
|
|
H000A
|
0.9001
|
0.8901
|
|
H000B
|
0.8423
|
0.8561
|
|
H000C
|
0.8723
|
0.8781
|
|
H000D
|
0.8554
|
0.8349
|
|
H000E
|
0.9001
|
0.9031
|
.
Using pairs (x,y) = ( ResStd(i), ResGold(i) ) and
LMS algorithm (least mean square approximation), the slope and
intercept values for LINEAR Normalization are calculated. The
resulting formula for the LINEAR normalization is:
|
y = slope*x + intercept,
|
|
where x is a measured value (raw value),
and y is a value after normalization.
|
|
|
and the Normalization line is
y = 0.909*x + 0.078.
.
You have a possibility to set the normalization coefficients manually.
To do that you click the Coefficients button in the Normalization
System dialogue box. The Normalization System - Coefficients
dialogue box appears:
.
7.
PRML CHIP
Since encoding and decoding is done by PRML chip when RWA is in the
PRML chip mode, the items d_ratio and k_ratio are ignored
in the PRML chip pattern files.
8.
THE POPCORN TEST MODIFICATION
Two new controls were added to Popcorn test configuration form:
- the Fine Delay check box and
- the UP Delay type combo box.
Fine Delay option
The default setting for the Fine Delay option is disabled.
It corresponds to the old mode of programming of the read and
write gates in the Popcorn test. The minimum value for the Delay
Before Read parameter is 1 m
Sec, as it was in previous versions of WITE. The accuracy of setting
the write to read delay (derived form the Delay Before Read parameter)
varies up to 2 m s and depends on the
flux frequency specified in the test configuration. The higher
is the frequency, the less is the error. You can observe both
write and read gate signals on the RWA Scope Point 3.
When the Fine Delay option is enabled, you can program
the Delay Before Read parameter in the Popcorn test setup
configuration form equal to zero. The granularity of the delay
parameter value in the Fine Delay mode is 250 nSec, so you can
set the delay value to 0 nSec, 250 nSec, 500 nSec and so
on. In this mode, the accuracy of setting the write to read delay
should not exceed 100 nSec. This inaccuracy is constant, it depends
on specific RWA tester, and it does not depend on the flux frequency
specified in the test configuration.
The drawback of the Fine Delay mode is that you cannot observe
the read gate signal on Scope point 3, if the ASSY REV of
RWA Control Board is less than "P". You can check your RWA Control
Board ASSY REV using the EEROM Viewer utility, which is
provided with your WITE32 software. All RWA testers manufactured
after 05/01/2000 have RWA Control Board ASSY REV "P" and above.
Currently, Guzik provides two options for fixing this hardware
problem:
- upgrade your RWA control board to allow observing the read
gate on scope point 3;
- order a special cable and install it inside an Analog Box
so that the read gate signal will be observed at the "Calibrator
out " test connector of an Analog Box, located at the front
panel of an Analog Box.
UP Delay control
No matter what a write to read delay you specify inside the popcorn
test setup, the Universal Preamplifier board delays opening of
the read signal after the end of the write gate for some amount
of time to bypass transitional effects inside a head amplifier.
The amount of time the Universal Preamplifier board delays opening
of the read signal is referred to as a UP Delay parameter.
By default, the value of the UP Delay parameter depends on the
Shut down read bias during Write setting in the Wite32
Configure | Preamp dialogue box. If this option is enabled
(no read bias during write operations), the UP Delay is equal
to 2 m Sec. If this option is disabled
(the read bias is turned on during write operations), the UP Delay
is equal to 0.9 µ Sec.
Starting from the Universal Preamplifier 7, P/N 307470, ASSY
REV "R", and WITE32 revision 2.50 the UP Delay parameter can be
controlled inside the Popcorn test. Three values are available
in the UP Delay combo box on the Popcorn test configuration setup
form:
|
Default
|
the value of the UP Delay parameter is determined by the
Shut down read bias during Write setting in the Wite32
Configure | Preamp dialogue box
|
|
0
|
UP7 does not apply any delay before opening the read signal
after the end of the write gate
|
|
0.9 m Sec
|
UP7 always uses the 0.9 m Sec
delay
|
.
The UP Delay combo box is disabled if your
system is equipped with a Universal Preamplifier board of an earlier
revision.
9.
PRECOMPENSATION FILTERS IN THE PATTERN DEFINITION LANGUAGE
The Pattern Definition Language has been extended to support
precompensation filters.
- Definitions
A precompensation filter is a collection of one or several
rules called precompensation rules.
A precompensation rule defines how values of precompensation
variables (A to I) are applied to the bit combinations defined
in patterns. Please refer to the WITE32 System Configuration
User’s Guide and the Pattern User’s Guide for detailed
description of precompensation values.
- Precompensation filters
The precompensation filter definition has syntax:
FLTDEF name
rule1
rule2
… … …
ruleN
FLTEND
where FLTDEF and FLTEND designate the precompensation
filter definition,
name is a unique precompensation filter name,
rule1, …, ruleN are precompensation rules.
A precompensation filter is defined in the global scope of a
PDL program.
- Precompensation rules
A precompensation rule is a sequence of zeroes, ones,
and/or nine letters from A to I. The letters from A to I
correspond to nine precompensation variables. The meaning
of these symbols is the following:
- A zero means the absence of a transition.
- A one means the transition with no precompensation
to be applied.
- A letter (A to I) means the transition, which must be precompensated
by the value of the corresponding precompensation variable.
In other words, a letter means a precompensated one.
4. An example of precompensation filter
The following is an example of precompensation filter definition:
FLTDEF MyFilter
10A
1BBB0
1AA0
FLTEND
This example defines a precompensation filter, which consists
of three rules:
10A – defines that the second
transition in any "101" bit combination will be precompensated
by the value of precompensation variable A.
1BBB0 – defines that the
second, third, and fourth transitions in any "11110" bit combination
will be precompensated by the value of precompensation variable
B.
1AA0 – defines that the second
and third transition in any "1110" bit combination will be
precompensated by the value of precompensation variable A.
5. Applying the precompensation filter to a pattern
You can specify a precompensation filter inside a pattern
or control block definition using the fltr attribute.
Example:
patdef MyPattern
scheme = RWAD
fltr = MyFilter
pattern = "01010001010001111000010100"*INF
patend
The result of applying the MyFilter precompensation
filter to MyPattern can be defined by the following
equivalent definition:
patdef MyPattern2
scheme = RWAD
pattern = "0101(A)000101(A)00011(B)1(B)1(B)0000101(A)00"*INF
patend
The PDL compiler processes a pattern bit sequence by matching
the consecutive fragments of the pattern bit sequence to the
precompensation rules defined by the precompensation filter.
Precompensation rules are matched in the order they are defined.
If any matched pair is found, the compiler applies the precompensation
rule to the bit sequence fragment by precompensating the bit
sequence transitions, which correspond to the letters inside
the precompensation rule.
10.
MISCELLANEOUS
- The caption of the Close Windows button on the WITE32
Engineering mode dashboard was changed to Close WITE Windows.
- The Close All menu item of the Control menu in
the WITE32 Engineering mode dashboard was renamed to Close
WITE Windows and moved to the File menu.
- Interface changes in the WITE Result Processor - Configuration
dialogue box:
- Pull-down menu is removed from this dialogue box.
- Buttons Save, Close and Save Stream
are added.
The Save button saves the changed parameters to the database
The Close button closes the dialogue box. If any parameters
have been changed, and the Save button has not been invoked, you are
prompted to save the parameters, or abandon the changes
The Save Stream button saves the results to a proprietary
format file, to be used for diagnostic purposes.
4. In the WITE Result Processor - Configuration dialogue box,
if the Append History option is enabled, but the history database
is not found on WITE32 startup, the WITE32 software suggests two options:
- create new history database,
- clear the history database name and disable the Append History
option.
5. In the WROffset test the default value for the Amplitude threshold
for Track Center calculation was changed from 95% to 80%. This
provides better repeatability of measured value of the WROffset. This
default will be applied to all products created in WITE32 ver. 2.50.
If you have products created in previous versions of WITE, it is recommended
to change the value of the Amplitude threshold for Track Center
calculation parameter to 80% manually.
6. Test elapsed time is exported to ASCII file. The value name for
this result is Elapsed, and the value format is HH:MM:SS.
7. You can perform the write flux operations with flux rates up to
500MFlux/s for RWA-1632 with Universal Preamplifier 7 installed.
8. The Track Profile Range parameters (From, To
and Step) as well as the Apply Results To radiobutton
setting in the Servo Calibration dialogue box were made zone
dependent.
9. The Max Track Number parameter for IMAN driver was changed
from 32000 to 399992.
10. The default value for the Asymmetric Measurement option
in the Configure | Test Options dialogue box is changed to
Enabled.
11. WITE32 disables the pull-down menu in the Engineering Mode dashboard
and also prevents you from exiting WITE32 during test, operation,
calibration, or initialization procedure execution. To exit WITE32:
- Press the Abort button to cancel the test, operation, or calibration
execution;
- Exit WITE32 by selecting the File | Exit menu item or
by closing the Engineering Mode dashboard window.
12. In the Spectrum Analyzer test the default vertical axis step
is set to 10dB, and the horizontal axis step is set to 10MHz.
13. For those tests that have graphic output, the number of text
lines on the plot is limited to 14 lines (when printing or saving
the plot as a file).
14. If the File | Enlarged saved bitmap option is enabled
in WITE32 plots, the plots can be saved into a bitmap file with larger
dimensions than the current screen dimensions. The resulting bitmap
file (BMP-file) can be imported into Microsoft Word with effectively
better resolution (approximately 200 DPI on letter-size page).
15. The EEPROM Viewer utility now
displays the EPROM contents of the PCI Beetle board (inside the computer).
16. New Pause operation is available for production sequences.
You can insert the Pause operation in your production sequence,
please refer to the WITE32 System Configuration Guide for details
on how to create and modify the production sequence. The Pause
operation suspends the production test, pops up a customized message
and waits for the operator to press the OK button.
17. The Index to Index write gate option is added in the Gate
and Track Format dialogue box. This option is available only when
sector mode is set to None. When this option is enabled, the
Write Gate is set to maximum possible extent (from index to index),
and your Start and Stop settings for the write gate become unavailable.
Fixed
Bugs
- When you run the production test many times WITE32 slows down
and eventually hangs up.
- If you select the Flux option in the Write Signal
frame of the Popcorn test, the actual flux rate will be twice
lower than specified in the Flux textbox.
- The Read Gate length significantly differs from specified in the
Gate and Track Format dialogue box, especially when system
is in the PRML chip mode.
- If a module registers and unregisters in a WITE32 session many
times, the "Registration failed" error message pops up.
- If some test generates many results and many records (more than
100 results per record) in a test session, WITE32 may crash.
- If there is a WITE32 instance running, starting a second instance
leads to General Protection Failure.
- If grade is deleted from the grade list, the grading module may
crash.
- The "Division by zero" error message in the PWN Stability
test, when the Iteration setup parameter of this test is
set to 1.
- When a new history database is created, the text fields in data
tables are not created correctly. The bug occurs when Operator ID,
Station ID, and/or Part ID field is empty. The test name information
is not saved to the history database in this case.
- Intermittent crashes of WITE32 while deleting Zone or Setup.
- If user goes to the Operator Panel and returns back to the Engineering
Mode dashboard, renaming a zone will fail in case of two-spinstand
configuration.
- The Internal TAA Calibration option in the Configure
| Test Options does not work in case of two-spinstand configuration.
- The Operator Panel sometimes does not recover to the "Ready" state
after RWA power interruption.
- The Operator Panel appears in the "Ready" state if you switch
from the Engineering Mode Dashboard to Operator Panel while RWA
is in the power off state.
- The Production Monitor test does not show the Serial
Numbers dialogue when it is run from the Operator Panel.
- WITE32 plots saved into a Bitmap file do not have grid lines.
- WITE32 plots saved into a Bitmap file have arbitrary background
color.
- In the Triple Track test the Squash result sometimes
is reported incorrectly (too low) if the Use Fast Offset
option is enabled.
- The description line is not updated in the Device Driver Parameter
Editor dialogue box after the Save or Reset button
is pressed and cursor was not on the first line.
- Installation of an already installed WITE32 external module crashes
WITE32.
- Intermittent error message "Not available function call" appears
on WITE32 startup for RWA-1632.
- Vertical scale of the graphic plot is not properly adjusted when
you turn off the Logarithmic Scale option in the Sampled
Value Distribution dialogue box.
- The SNR result of Digital Parametric test is incorrect in sector
mode.
- The Offtrack Performance test reports the Offtrack distance =
0 if the Error Rate Level parameter value in the Offtrack
Performance test configuration form is equal to the Sampling
Level parameter value in the Comparator Error Rate test configuration
form.
- When spinstand is connected to COM2: the software creates calibration
files with extension .CL2 (instead of .CLB). This problem is observed
in WITE32 versions 2.40 – 2.45. If your spinstand is connected to
COM2 and you install WITE32 ver. 2.50, you either need to re-calibrate
the tester (the Calibration menu in the WITE32 Engineering
Dashboard), or you should rename your *.CL2 files to *.CLB files.
- The "Program relation too complex" error message in non-sector
mode when system clock is above 830 Mbit/s and RPM is lower
than 3600 RPM.
- The production interpreter runs the special "_Zoutside" zone as
a regular zone (i.e. spinstand is started and heads are loaded),
when you run the Production test from the Operator panel. The bug
was introduced in revision 2.40.
- The "Control element doesn’t exist" error message pops up after
you invoke Zone parameter editing procedure for radio button controls.
- The step size and range is slightly different for the forward
and backward run of the Track Profile test and the WROffset tests.
- The values of the Use Fast Offset and Plot Data
options in the Triple Track test setup are swapped.
- Intermittent corruption of the Pattern Generator memory after
switching between PRML chip mode and Guzik PRML/Peak Detection mode.
This bug causes wrong pattern and/or flux frequency to be written.
- Negative erase doesn’t work if the start of the write gate is
not set to minimum.
- In some configurations the optimization test sets the values of
the read bias or write current out of specified in the test setup
limits, which can lead to head damage.
- Guzik Channel optimization test sets wrong read bias current if
you enable Read Bias optimization in the Initial setting frame,
specify negative value in the Read Bias From field, and positive
value in the Read Bias To field.
- Intermittent run time error during initial setup in the PRML chip
module.
- Intermittent run time error if user makes a manual selection of
PRML chip type instead of automatic selection.
- MR Saturation test generates error message "Divide by 0" if the
TAA measurement failed.
- Wrong MR measurements in voltage mode for VM5410D2 head amplifier.
Known
problems and solutions
- The WITE32 ver. 2.50 requires updated Chip PRML drivers.
The following updated drivers are provided on the WITE32 installation
CD:
- Venom,
- M16 / M16+ / Coral,
- SSI4937A.
If in previous revisions of WITE32 you were using the Chip PRML
drivers other than listed above, you need to request updated drivers
for WITE32 ver. 2.50.
- If you are using Guzik PCI Host adapter and/or PCI Beetle board
and you have problems with installation of those boards, please
check the "Plug & Play OS" setting in the BIOS of your computer.
Please refer to the manual shipped with your computer for details
on how to run BIOS setup utility. We recommend to set the "Plug
& Play OS" value to OFF (or NO). This allows BIOS to configure
your PnP/PCI devices.
- After installation of WITE 2.50, the Spinstand Alignment Program
(WDCP) ver. 2.41 – ver. 2.45 ceases to detect the TMS spinstand
interface of the Guzik PCI host adapter. The Distance, Balancing
and Scale Alignment tests become not available. This happens only
when WDCP is invoked from WITE32. The standalone WDCP does not have
this problem.
- If you have WITE32 ver. 2.50 installed, and you install WITE32
ver. 2.45 or earlier, your WITE32 ver. 2.50 will stop working with
Guzik PCI host adapter and/or PCI Beetle board. You will get one
of the following error messages while starting WITE32 ver. 2.50:
- PCI problems: WinDriver version too old. Run Installation again
and RESTART Computer.
- PCI problems: WinDriver version too old or license not valid.
Run Installation again and RESTART Computer.
- PCI problems: WinDriver not installed. Run Installation again
and RESTART Computer.
|
