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New WITE32 Immediate Start Mode for Shorter Test Time

  • Typical Test Time Improvement 20–30%
  • Supported by Latest Revisions of RWA‑2000 Series
New WITE32 Immediate Start Mode for Shorter Test Time
Overview
Hardware and Software Requirements
Brochure

The new mode of Guzik Test System operation allows for performing tests approximately 20–30% faster.  This is an optional purchase component of WITE32, which requires a license.

The two new enhanced performance modes are Immediate Start Mode (Full Revolution) and Immediate Start Mode (Partial Revolution). The following four modes of operation are available in WITE32 version 4.00:

  • Mode 1: Start on Index (Full Revolution)
  • Mode 2: Start on Index (Partial Revolution)
  • Mode 3: Immediate Start (Full Revolution)
  • Mode 4: Immediate Start (Partial Revolution)

Please refer to the chart below for comparison of the typical production test time for all four modes.

typical test productio test time

The production test was configured for one zone, 7200 RPM, and included the following sequence of tests:

·         Servo Erase

·         Write Servo

·         Band Erase

·         W/R Offset

·         SNR with Crest Factor

·         PWN Asymmetry

·         Parametric

·         Spectral Integral SNR

·         Triple Track

The measured test time does not include cartridge handling time and spinstand start/stop time.

 

  • RWA-2000 series with RWA Control Board 2 (Guzik P/N 325800)-0
  • Guzik or Canon spinstand
  • WITE32 software revision 4.00
  • Software license

You can determine whether your test system supports the immediate start mode in the Info | Hardware Features… dialog box. If your RWA is not compatible with Immediate Start Mode, please contact sales@www.guzik.com to obtain a quotation for upgrade. Please send us the RWA EEPROM Dump with your request.

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