Feature Support

WITE32 supports all features (such as PRML channels, Guzik servo, analog and digital parametric tests etc.) for current Guzik RWA models and all Guzik spinstands.

Open Software Architecture

WITE32 environment supports integration of user-defined external tests, called external modules. You can create external modules using Microsoft Visual Basic or Visual C++, using a simple interface protocol.

Results Output

WITE32 displays test results (including user defined tests) in a user-configurable spreadsheet style. You control the decimal point precision, fonts, width, and sequence of each displayed result. By enabling a history database (either locally or on a network) the results of all tests are stored in that database for manipulation (using Microsoft Access, or the data can be exported to any format that Microsoft Access supports, such as Lotus or Excel). The run-time results are kept in memory, which allows for faster execution of the tests.

Grading and Normalization

WITE32 production environment supports an unlimited number of grades, which are color-coded for easy reading. Simply drag the grade definition line higher or lower in the stack to perform grade prioritization. The grades are defined for individual heads and entire head stacks. When a grade fails, you can easily check the failed parameters. WITE32 normalization system can be enabled to generate correction factors that correlate results to a set of goal measurement criteria. User defined tests are included in grading scheme.

WITE32^™Standard Tests

Parametric Tests

TAA Test
Overwrite Test
Asymmetry Test
Pulse Width Test
Parametric Test
Read-Only Parametric Test
Signal-to-Noise Ratio Test
Spectral Integral Signal-to-Noise Test
Amplitude Stability Test
Sector Amplitude Stability Test
Resolution Delta Test
Pulse Width Stability Test

Composite Tests

Frequency Test
Saturation Test
Track Profile Test
MR Saturation Test
Pulse Profile Test
Comparator Error Rate Test
Off-Track Performance Test
Set RPM Test
Spectrum Analysis Test
Triple Track Test

MR Tests

TAA Asymmetry Test
Pulse Width Asymmetry Test
Pulse Stability Test
Write/Read Offset Test
MR-Impedance Test
WR-Impedance Test
Head Polarity Test

WCALC – WITE Calculator

WITE Calculator for Tests

Error Tests

Comparator Test
Popcorn Test

NLTS Tests

Pseudo-Random Sequences
Alternative Spectral Elimination Test
Third Harmonic Ratio Test
MR Transfer Curve Test
Alternate Overwrite Test
NLTS vs. Write Current Test
Signal/Noise Ratio Test

Digital Parametric Tests
(with D5000 or RWA-2585 family)

Digital Parametric Test
Signal Profile

PRML Tests (with RWA-2585 family)

Guzik Channel Optimization
Sequenced Amplitude Margin (SAM) Test
Sampled Values Distribution (SVD) Test

PRML Tests (with D5000)

Guzik PRML Channel Optimization
PRML Explorer
Sequenced Amplitude Margin (SAM) Test

Jitter Tests (with D5000)

Jitter Explorer
Media Noise Test

Optimization Tests

System Optimization

Spinstand Tests

Servo Position Error Signal Test (PES Test)
Off-track Modulation Test
Scale Correction Test (Optional Purchase)

WDCP Tests

Balancing (for 1701 and 312 spinstand families)

Spinstand 2002 Tests

Balancing (for V2002 spinstands)
XY Alignment
Head Alignment

WITE32^™Optional Purchase Tests

WESA – Write Excited
Sectored Amplitude Tests

Separate Amplitude Asymmetry Stability
Triple Amplitude Asymmetry Stability
Write Induced Instability
Pole Erasure

WATI – Adjacent Track
Interference Tests

Adjacent Track Interference Test
Adjacent Track Interference Multi-Track Test (WATI MT)

Micro-Actuator Tests

Stroke Test
Mechanical Frequency Response Test
Micro-Actuator Loop Setup Test
Micro-Actuator Loop Frequency Response Test

Perpendicular Parametric Tests

Differentiator Optimization
Roll-off
Rise and Fall Time
Saturation Asymmetry
Amplitude Asymmetry

3D Pulse Profile (with D5000)

3D Pulse Profile Test

Digital MSCAN – Media
Scanning (with D5000)

Missing Pulse Detection
Super Pulse Detection
Transition Shift Detection
Thermal Asperity Detection (written signal)
Thermal Asperity Detection (erased track)

MSCAN – Media PRML
Scanning Tests

Extra Pulse Detection
Missing Pulse Detection
Thermal Asperity Detection

Triple-Track Tests

Triple-Track Signal-to-Noise Test
(with 747 option)

747 Tests*

747 Comparator Error Test

Bit Error Rate (BER) Tests

BER 747A Test
BER Linear Density Test
BER Error Distribution Test
BER Performance Test

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* Deprecated test module, using BER 747A Test is recommended

WITE32^™ Extensions

WDK32 – WITE Developer’s Kit

WDK32 is a software package that allows you to create external test modules for WITE32 using Microsoft Visual Basic or Visual C++ revision 6.0. The compiled custom external module can be used in both Engineering and Production environment.

WDK32 Script – A Script Version of WITE Developer’s Kit

A script version of Guzik WITE32 Developer’s Kit (WDK32) allows for interactive execution of all Guzik WDK32 functions including RWA and spinstand control functions, operations, and measurement functions. WDK Script, based on Microsoft Visual Basic for Applications (VBA) engine, is integrated into Microsoft Excel.

Using WDK Script you can execute any Guzik WDK32 function or subroutine interactively either from the VBA environment or directly from an Excel worksheet. You can write your own scripts, using all the functionality of Guzik WDK32 but without the complication associated with the WDK32 WITE external module interfaces, licensing, and the necessity to have Microsoft Visual Basic installed.

WDDR32 – WITE Device Driver Template

WDDR32 is a software package for developing device drivers for the third party spinstands and connecting them to
Guzik RWA and WITE32.

DDK – PRML Chip Driver Developer’s Kit

DDK is a software package that allows for developing software drivers for PRML chip channels integrated into Guzik Read-Write Analyzers. The PRML chip drivers are developed using Microsoft Visual C++ programming language.

WITE32

Guzik software package for Read/Write Analyzer (RWA) control