New Product Releases (By Date)
2009
WDM 5121 Waveform Digitizer
This single channel waveform digitizer with up to 40 Gs/sec sampling rate and 13 GHz analog bandwidth provides industry-leading waveform memory of 4 Gpoints. Perfect for high speed waveform acquisition requirments in ATE and OEM systems applications. Custom hardware-based waveform processing is also available to speed measurement throughput.Learn more...
WDM 5082 Waveform Digitizer
This two channel waveform digitizer with up to 20 Gs/sec sampling rate and 8 GHz analog bandwidth provides industry-leading eaveform memory of 2 Gpoints per channel. Perfect for high speed waveform acquisition requirments in ATE and OEM systems applications. Custom hardware-based waveform processing is also available to speed measurement throughput.Learn more...
DTR 3000 Discrete Track Recording Test System
The Guzik DTR Test System belongs to a new generation of Guzik test systems designed for R&D and Production of the Discrete Track Recording components. The system features up to 4 GBit/s write channel, up to 12 GHz read channel connected to 40 GS/s waveform digitizer, highly stable spinstand platform designed for recording densities beyond 700kTPI, and the state of the art programmable drive servo decoder for DTR servo decoding. Learn more...
WDM 5044 Waveform Digitizer
This four-channel waveform digitizer with up to 20 Gs/sec sampling rate and 6 GHz analog bandwidth supports the entire spectrum of parametric measurements, digital media scanning, jitter and eye diagram analysis, and fast spectral measurements. It is a new generation of the modular test equipment based on ATCA platform. The WDM 5044 adds the ability to perform digital measurements with the DTR 3000 test system.Learn more...
Sector Measurements Test Module
The Sector Measurements WITE32 test module with the Sector Sweep test varies one of the
system parameters (such as off-track offset or clock), performs one or several WITE32 standard
measurements, and reports measurement results per sector. Each measurement
has dedicated preconditioning setup. This feature combined with the ability to sweep almost any
system parameter allows this test to execute the algorithms of most WITE32 profile-style tests, such as
Track Profile, Saturation, MR Saturation, Frequency, Off-track Performance, and report results per sector.Learn more...
Parametric TFC Module
Parametric TFC allows for adjusting the value of the write-mode TFC power, in milli-watts, depending
on write-related parameters.Learn more...
Piezo Actuator Cartridge with AE Sensor for DTR3000 and V2002 Spinstands
The new generation of Guzik cartridges is equipped with Piezo actuator and integrated AE sensor to achieve higher servo closed loop bandwidth.
The typical bandwidth is in the range of 2-3 kHz. This allows for non-repeatable run-out reduction down to 0.35-0.60 nm (0.014-0.024 mInch), 1s.
The higher servo bandwidth also improves seek time, which leads to test time improvement for several tests. Learn more...
2008
V2002 Spinstand Revision 16 for Improved Cleanroom Application
The new Revision 16 of Guzik V2002 spinstand is updated with pneumatic components specifically designed for cleanroom applications.Learn more...
UP10 Universal Preamplifier
Universal Preamplifier 10 (UP10) is designed for high-speed operation with Guzik RWA 2000 series. UP10 allows the RWA2000 series to achieve the maximum data rate 4 Gbit/sec and beyond. UP10 will support the future generations of test equipment and head amplifiers with higher data rates.Learn more...
MR7 Read/Write Amplifier
Guzik MR7 amplifier is designed for high-speed operation with RWA-2000 series. Compared with MR5 head amplifier, it has much wider bandwidth of write and read channels and significantly faster rise/fall time of write current. As a result, the MR7 can operate with data speed up to 4 Gbit/sec.Learn more...
WITE32 Immediate Start Mode for Shorter Test Times
The new mode of Guzik Test System operation allows for performing tests approximately 20-30% faster. This is an optional purchase component of WITE32, which requires a license.Learn more...
Adjacent Track Interference Multi-Track test (WATI-MT)
Multi-Track ATI Test evaluates the effect of multiple writing of a data track on the wide range of adjacent tracks. The test measures the change of TAA or SpiSNR values of the adjacent tracks after writing the data track.Learn more...
Improved Adjacent Track Interference Test (WATI 2)
Adjacent Track Interference test evaluates the effect of multiple writing of a track onto the neighboring tracks. The test measures the change of TAA, SNR, and BER values after writing the adjacent tracks.Learn more...



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