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Head and Media Disk Drive Test

Read-Write Analyzers

Read-Write Analyzer Systems 4000 Series

Read-Write Analyzer Systems 4000 Series

The 4000 Series RWA System belongs to a new generation of Guzik test systems. Read-back signal from HGA is sampled using the high-speed A/D Converter of GSA 6000 unit with sampling rate up to 20 GSPS and ultra-deep memory up to 64GBytes. This approach allows for a direct measurement of perpendicular magnetic recording (PMR) signal, as opposed to indirect methods based on analog peak detector approach. No analog differentiator is required. The A/D converter chipset is provided by a major oscilloscope manufacturer; therefore you can expect the same digitized signal quality as you would from high-end oscilloscopes.

Guzik Signal Analyzer GSA 6000 Series

Guzik Signal Analyzer GSA 6000 Series

Guzik GSA 6000 series Signal Analyzer combines high-speed waveform digitizer with built-in digital signal processing hardware and high-speed data transfer link to a computer. The Signal Analyzer comes in a space-saving display-less 2U 19” rack-mounted form factor.

8 Gbit/s Read-Write Analyzer RWA 4000

8 Gbit/s Read-Write Analyzer RWA 4000

RWA 4000 Read-Write Analyzer is a part of the new generation all-digital Guzik 4000 Series test systems. RWA 4000 requires Guzik signal analyzer GSA 6000 series to provide a complete RWA solution for magnetic recording test applications.

RWA DTR 3000 Series – Discontinued

RWA DTR 3000 Series – Discontinued

Base models are capable of 2Gbit/sec, 3Gbit/sec, and 4Gbit/sec Provide tests and measurements of both DTR and non-DTR components (heads and disk drive media) DTR 3000 Series can work with both Guzik and non-Guzik spinstands

RWA DTR 3004 Series – Discontinued

RWA DTR 3004 Series – Discontinued

4Gbit/sec Maximum Data Rate 2GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* Drive Servo Decoder for DTR Testing Guzik Servo Writing and Processing PRML Chip Integration up to 4Gbit/s ________________ * US Patent 6,760,171 B2

RWA DTR 3003 Series – Discontinued

RWA DTR 3003 Series – Discontinued

3Gbit/sec Maximum Data Rate 1.5GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* Drive Servo Decoder for DTR Testing Guzik Servo Writing and Processing PRML Chip Integration up to 4Gbit/s ________________ * US Patent 6,760,171 B2

RWA DTR 3002 Series- Discontinued

RWA DTR 3002 Series- Discontinued

2Gbit/sec Maximum Data Rate 1GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* Drive Servo Decoder for DTR Testing Guzik Servo Writing and Processing PRML Chip Integration up to 4Gbit/s ________________ * US Patent 6,760,171 B2

Signal Analyzers for Tektronix TDS 7000 Series Oscilloscopes – Obsolete

Signal Analyzers for Tektronix TDS 7000 Series Oscilloscopes – Obsolete

Guzik Hardware Accelerator Card for real-time signal analysis and data processing Comprehensive Packages for Disk Drive Analysis, Jitter and Eye Diagram Analysis Convenient and intuitive Windows-based User Interface optimized for touch-screen applications

Read-Write Analyzer 2004 – Discontinued

Read-Write Analyzer 2004 – Discontinued

Up to 8 Gbit/s maximum write data rate (RWA 4008 model)
Pattern Generator with 1psec resolution of bit precompensation
PRML Chip integration using a daughter card with easy access through front panel

Read-Write Analyzer 2003 – Discontinued

Read-Write Analyzer 2003 – Discontinued

3Gbit/sec Maximum Data Rate 1.5GHz Analog Bandwidth for all Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* PRML Chip Integration up to 4Gbit/s Servo Writing and Processing ________________ * US Patent 6,760,171 B2

Read-Write Analyzer 2002 – Discontinued

Read-Write Analyzer 2002 – Discontinued

2Gbit/sec Maximum Data Rate 1GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* PRML Chip Integration to 2Gbit/sec Servo Writing and Processing ________________ * Patent pending.

Read-Write Analyzers-2585A PRML – Obsolete

Read-Write Analyzers-2585A PRML – Obsolete

Up to 1Gbit/s Guzik Programmable PRML Channel Digital Clock Recovery Digital parametric measurements 20 Taps Digital Equalizer 2G samples/s 8 bit ADC Signal display with 4 Mbytes Memory Servo Mode (with Guzik spin stands) Guzik Proprietary PRML channel with data rates up to 1G bit/s PRML chip integration with data rate up to 1G bit/s

Read-Write Analyzers- 2585B – Obsolete

Read-Write Analyzers- 2585B – Obsolete

The difference between RWA-2585B PRML 1G and older testers is a new revision of PRML Chip Adapter Interface motherboard.

Read-Write Analyzers-2585S – Obsolete

Read-Write Analyzers-2585S – Obsolete

Up to 1Gbit/s Guzik Programmable PRML Channel Digital Clock Recovery Digital Read-back Signal Shape Defect Compensation Digital parametric measurements Digital Programmable Filter for Parametric Measurements 20 Taps Digital Equalizer 2G samples/s 8 bit ADC Digital Scope Mode with 4 Mbytes Memory Servo Mode (with Guzik spin stands) Guzik Proprietary PRML channel with data rates up

Read Write Analyzers-2550 Plus – Obsolete

Read Write Analyzers-2550 Plus – Obsolete

800 Mbit/s PRML Channel Analyzer 550 MHz Analog Bandwidth Significantly increased throughput PRML chip integration with data rates to 800 Mbits/sec. Fast PRML channel optimization 800Mflux/s programmable Pattern Generator Bit precompensation with 20ps resolution 400MHz bandwidth Spectrum Analyzer Supports universal preamplifier UP-7 and TSA-compatible cartridge Bit shift analysis 250 MFlux/s (333Mbit/s with 1-7 code) Optional

Read-Write Analyzers-2550 – Obsolete

Read-Write Analyzers-2550 – Obsolete

Significantly increased throughput PRML chip integration with data rates 800Mbit/s Fast PRML channel optimization 800 Mflux/s programmable Pattern Generator Bit precompensation with 5 ps resolution 400 MHz bandwidth Spectrum Analyzer Supports UP7/UI7 SP Supports TSA-Compatible Cartridges Supports Guzik Head Amplifiers Optional Differentiates

Read-Write Analyzers 1632 – Obsolete

Read-Write Analyzers 1632 – Obsolete

320 Mbit/s PRML Channel Analyzer 160 Mbit/s Peak Detector Channel Analyzer PR4, EPR4, E2PR4 Modes up to 320 Mbits/s Peak Detector Mode up to 160 Mbits/s Programmable Clock Recovery 320 Mflux/s Pattern Generator 12 Tap 12 Bit Equalizer (60 to 200 Mbits/s) 24 Tap 12 Bit Equalizer (80 to 320 Mbits/s) Optional PRML Channel Chips

Read-Write Analyzers-1601 – Obsolete

Read-Write Analyzers-1601 – Obsolete

The Guzik Read Write Analyzer RWA-1601 is a measurement tool used for design and analysis of magnetic storage devices and components.

Software

WITE32

WITE32

WITE32 is the latest Guzik software package for Read/Write Analyzer (RWA) control. The open design architecture of the package provides flexibility and expendability to both user and designer. WITE32 is developed under Microsoft Windows 32-bit environment…

WITE32 Developer’s Kit (WDK32)

WITE32 Developer’s Kit (WDK32)

The WDK Version 3.02 is released to work with WITE32 Version 3.02 (or later) Note:  Guzik Technical Enterprises reserves the right to change the functionality of both the WITE32 software and the WITE32 Developer’s Kit (WDK) software at any time, thereby requiring you to upgrade both WITE32 and the WDK to the new release, to

Servo Improvement Package

Servo Improvement Package

With today’s high track densities, using embedded servo to provide accurate and repeatable positioning is a requirement. Guzik V2002 now supports two modes of servo operation:
• Standard Servo Mode (included in WITE32)
• New Servo Mode (optional, included in the Servo Improvement package)

WDK Script: Microsoft Excel-Based Scripting For WITE32

WDK Script: Microsoft Excel-Based Scripting For WITE32

The new script version of Guzik WITE32 Development Kit (WDK32) allows for interactive execution of all Guzik WDK32 functions including RWA and spinstand control functions, measurement functions, and operations.

Parametric TFC Control

Parametric TFC Control

Dynamic adjustment of write-mode TFC power, depending on four parameters: Write current Write current overshoot amplitude Write current overshoot duration Write signal frequency Works transparently with WITE32, Guzik test modules, and WDK-based custom modules Calculates write signal frequency depending on a data pattern, not just write clock

Sector Measurements Test Module

Sector Measurements Test Module

Most of WITE32 standard measurements with per-sector results Capability to sweep/vary most of WITE32 system parameters Integrated graphical result display Capability to export all raw test results to a text file

Perpendicular Recording Test Package For WITE32

Perpendicular Recording Test Package For WITE32

Amplitude Asymmetry Test Differentiator Optimization Test Rise-and-fall Time (T50) Test Rolloff Test Saturation Asymmetry Test

Write-Excited Sectored Amplitude (WESA) Test Package

Write-Excited Sectored Amplitude (WESA) Test Package

The Write-Excited Sectored Amplitude (WESA) test package is a new WITE32 external module. The module implements a set of tests that analyze different physical aspects of how a write operation can affect a subsequent read operation.

Bit Error Rate (BER) Module for WITE32

Bit Error Rate (BER) Module for WITE32

The BER Module is designed to provide various tests based on Bit Error Rate (BER) measurement using PRML channel.

Digital Frequency Domain Analysis with D5000 Signal Analyzer Software

Digital Frequency Domain Analysis with D5000 Signal Analyzer Software

D5000 Signal Analyzer Software allows for performing spectrum analysis much faster and in a wider frequency range comparing to standard SA-960 spectrum analyzer of RWA-2000 series.

Media Scanning Package (MSCAN)

Media Scanning Package (MSCAN)

The Media-Scanning Package (MSCAN) detects a variety of defects on media. It also provides a software environment to develop new media-scanning and defect-reporting modules. Such modules can be created for PRML Channel, Read-Write Analyzer (RWA), or custom-designed hardware.

D5000 MSCAN ETA Erased Track Thermal Asperity and Extra Pulse Scanner

D5000 MSCAN ETA Erased Track Thermal Asperity and Extra Pulse Scanner

Thermal Asperity and Extra Pulse detection on erased track Multi-threshold amplitude analysis of positive and negative signal peaks 10 detectors can run in parallel with different settings/thresholds Digital low-pass filtering with programmable cut-off frequency High 15-bit resolution of detection thresholds  

D5000 Digital Media Scanning

D5000 Digital Media Scanning

Transition time shift (bit shift) and amplitude analysis Various defect detectors for simultaneous analysis of bit shift, missing pulses, super pulses, and thermal asperities Multi-threshold amplitude analysis at positive and negative signal peaks 24 detectors can run in parallel with different settings/thresholds Time shift (bit shift) analysis by zero-crossing detection for perpendicular recording High sampling

3D Pulse Profile Test for Nano-Scale Magnetic Field Imaging

3D Pulse Profile Test for Nano-Scale Magnetic Field Imaging

Build 3D and 2D Plots of Individual Magnetic Transitions Along-the-track Sampling Period 0.1ns (2nm at 7200RPM, MD location)* Cross-track Accuracy 0.4nm (1 s) with Guzik Servo** Non-destructive Measurements Scan Time less than 20 Seconds for 10mm ´ 10mm Area with 12 nm Step Compatible with Perpendicular and Longitudinal Products ________________ * All specifications are subject to change.

Micro Actuator Tests for V2002 Spinstands

Micro Actuator Tests for V2002 Spinstands

Micro Actuator is a device located on the suspension of a magnetic head
that can transform applied voltage to radial displacement of the head.

Improved Adjacent Track Interference Test (WATI 2)

Improved Adjacent Track Interference Test (WATI 2)

Faster Test Execution Less Number of Retry Operations More Successfully Written Sectors TAA Measurement SNR Measurement BER Measurement  

Adjacent Track Interference Multi-Track Test (WATI MT)

Adjacent Track Interference Multi-Track Test (WATI MT)

Multiple Side Tracks Configurable by User TAA Measurements SpiSNR Measurements

New WITE32 Immediate Start Mode for Shorter Test Time

New WITE32 Immediate Start Mode for Shorter Test Time

The new mode of Guzik Test System operation allows for performing tests approximately 20–30% faster. This is an optional purchase component of WITE32, which requires a license.

Spinstands

V2002 Spinstand Automation for Media Testing with XY-Positioning

V2002 Spinstand Automation for Media Testing with XY-Positioning

Guzik V2002 spinstand is created for testing Head Gimbal Assemblies (HGA), Head Stack Assemblies (HSA), Head Arm Assemblies (HAA), as well as for the media testing.

DTR 3000 System

DTR 3000 System

The Guzik DTR Test System belongs to a new generation of Guzik test systems designed for R&D and Production of the Discrete Track Recording components.

DTR 3000 Spinstand with XY-Positioning

DTR 3000 Spinstand with XY-Positioning

Guzik DTR 3000 spinstand is created for testing Head Gimbal Assemblies (HGA), Head Stack Assemblies (HSA), Head Arm Assemblies (HAA), as well as for the DTR and non-DTR media testing.

1701MP – Obsolete

1701MP – Obsolete

The Guzik S-1701MP Micro Positioning Spinstand is equipped with a patented² closed loop positioning system consisting of a piezo substage and precision optical scales with 0.04 µIn resolution.

1701A – Obsolete

1701A – Obsolete

Guzik S-1701A Micro Positioning Spinstand is dynamically improved2 over its predecessors 1701MP and 1701CF.

1701A+ – Obsolete

1701A+ – Obsolete

Guzik S-1701A+ Micro Positioning Spinstand achieves a better electrical and mechanical noise isolation compared to its predecessor S-1701A due to its separated control box and spinstand.

1701B – Obsolete

1701B – Obsolete

Guzik S-1701B Micro Positioning Spinstand achieves better electrical and mechanical noise isolation compared to its predecessors S-1701A and S-1701A+ due to its separated control box and spinstand and air shock absorbers, installed inside the spinstand frame.

Optical Scales Correction for Guzik Spinstand S1701B – Obsolete

Optical Scales Correction for Guzik Spinstand S1701B – Obsolete

Better Test Results Repeatability on Different Spinstands Up to Three Times Better Spinstand Positioning Accuracy Up to Two Times Better Accuracy of W/R Offset Measurements

Spinstand 312MP – Obsolete

Spinstand 312MP – Obsolete

Micro Positioning system delivers 1 µInch positioning repeatability. Linear Simulation of Rotary Skew configurable from -7 to +22 degrees. Available factory upgrade from standard S-312 to S-312MP. Builds on recognized Guzik S-312 reliability, durability, installed base and industry experience.