Head and Media Disk Drive Test
The 4000 Series RWA System belongs to a new generation of Guzik test systems. Read-back signal from HGA is sampled using the high-speed A/D Converter of GSA 6000 unit with sampling rate up to 20 GSPS and ultra-deep memory up to 64GBytes. This approach allows for a direct measurement of perpendicular magnetic recording (PMR) signal, as opposed to indirect methods based on analog peak detector approach. No analog differentiator is required. The A/D converter chipset is provided by a major oscilloscope manufacturer; therefore you can expect the same digitized signal quality as you would from high-end oscilloscopes.
Guzik GSA 6000 series Signal Analyzer combines high-speed waveform digitizer with built-in digital signal processing hardware and high-speed data transfer link to a computer. The Signal Analyzer comes in a space-saving display-less 2U 19” rack-mounted form factor.
RWA 4000 Read-Write Analyzer is a part of the new generation all-digital Guzik 4000 Series test systems. RWA 4000 requires Guzik signal analyzer GSA 6000 series to provide a complete RWA solution for magnetic recording test applications.
Base models are capable of 2Gbit/sec, 3Gbit/sec, and 4Gbit/sec Provide tests and measurements of both DTR and non-DTR components (heads and disk drive media) DTR 3000 Series can work with both Guzik and non-Guzik spinstands
4Gbit/sec Maximum Data Rate 2GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* Drive Servo Decoder for DTR Testing Guzik Servo Writing and Processing PRML Chip Integration up to 4Gbit/s ________________ * US Patent 6,760,171 B2
3Gbit/sec Maximum Data Rate 1.5GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* Drive Servo Decoder for DTR Testing Guzik Servo Writing and Processing PRML Chip Integration up to 4Gbit/s ________________ * US Patent 6,760,171 B2
2Gbit/sec Maximum Data Rate 1GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* Drive Servo Decoder for DTR Testing Guzik Servo Writing and Processing PRML Chip Integration up to 4Gbit/s ________________ * US Patent 6,760,171 B2
Guzik Hardware Accelerator Card for real-time signal analysis and data processing Comprehensive Packages for Disk Drive Analysis, Jitter and Eye Diagram Analysis Convenient and intuitive Windows-based User Interface optimized for touch-screen applications
Up to 8 Gbit/s maximum write data rate (RWA 4008 model)
Pattern Generator with 1psec resolution of bit precompensation
PRML Chip integration using a daughter card with easy access through front panel
3Gbit/sec Maximum Data Rate 1.5GHz Analog Bandwidth for all Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* PRML Chip Integration up to 4Gbit/s Servo Writing and Processing ________________ * US Patent 6,760,171 B2
2Gbit/sec Maximum Data Rate 1GHz Analog Bandwidth for All Parametric Measurements Pattern Generator with 1psec Resolution of Bit Precompensation* PRML Chip Integration to 2Gbit/sec Servo Writing and Processing ________________ * Patent pending.
Up to 1Gbit/s Guzik Programmable PRML Channel Digital Clock Recovery Digital parametric measurements 20 Taps Digital Equalizer 2G samples/s 8 bit ADC Signal display with 4 Mbytes Memory Servo Mode (with Guzik spin stands) Guzik Proprietary PRML channel with data rates up to 1G bit/s PRML chip integration with data rate up to 1G bit/s
The difference between RWA-2585B PRML 1G and older testers is a new revision of PRML Chip Adapter Interface motherboard.
Up to 1Gbit/s Guzik Programmable PRML Channel Digital Clock Recovery Digital Read-back Signal Shape Defect Compensation Digital parametric measurements Digital Programmable Filter for Parametric Measurements 20 Taps Digital Equalizer 2G samples/s 8 bit ADC Digital Scope Mode with 4 Mbytes Memory Servo Mode (with Guzik spin stands) Guzik Proprietary PRML channel with data rates up
800 Mbit/s PRML Channel Analyzer 550 MHz Analog Bandwidth Significantly increased throughput PRML chip integration with data rates to 800 Mbits/sec. Fast PRML channel optimization 800Mflux/s programmable Pattern Generator Bit precompensation with 20ps resolution 400MHz bandwidth Spectrum Analyzer Supports universal preamplifier UP-7 and TSA-compatible cartridge Bit shift analysis 250 MFlux/s (333Mbit/s with 1-7 code) Optional
Significantly increased throughput PRML chip integration with data rates 800Mbit/s Fast PRML channel optimization 800 Mflux/s programmable Pattern Generator Bit precompensation with 5 ps resolution 400 MHz bandwidth Spectrum Analyzer Supports UP7/UI7 SP Supports TSA-Compatible Cartridges Supports Guzik Head Amplifiers Optional Differentiates
320 Mbit/s PRML Channel Analyzer 160 Mbit/s Peak Detector Channel Analyzer PR4, EPR4, E2PR4 Modes up to 320 Mbits/s Peak Detector Mode up to 160 Mbits/s Programmable Clock Recovery 320 Mflux/s Pattern Generator 12 Tap 12 Bit Equalizer (60 to 200 Mbits/s) 24 Tap 12 Bit Equalizer (80 to 320 Mbits/s) Optional PRML Channel Chips
The Guzik Read Write Analyzer RWA-1601 is a measurement tool used for design and analysis of magnetic storage devices and components.
WITE32 is the latest Guzik software package for Read/Write Analyzer (RWA) control. The open design architecture of the package provides flexibility and expendability to both user and designer. WITE32 is developed under Microsoft Windows 32-bit environment…
The WDK Version 3.02 is released to work with WITE32 Version 3.02 (or later) Note: Guzik Technical Enterprises reserves the right to change the functionality of both the WITE32 software and the WITE32 Developer’s Kit (WDK) software at any time, thereby requiring you to upgrade both WITE32 and the WDK to the new release, to
With today’s high track densities, using embedded servo to provide accurate and repeatable positioning is a requirement. Guzik V2002 now supports two modes of servo operation:
• Standard Servo Mode (included in WITE32)
• New Servo Mode (optional, included in the Servo Improvement package)
The new script version of Guzik WITE32 Development Kit (WDK32) allows for interactive execution of all Guzik WDK32 functions including RWA and spinstand control functions, measurement functions, and operations.
Dynamic adjustment of write-mode TFC power, depending on four parameters: Write current Write current overshoot amplitude Write current overshoot duration Write signal frequency Works transparently with WITE32, Guzik test modules, and WDK-based custom modules Calculates write signal frequency depending on a data pattern, not just write clock
Most of WITE32 standard measurements with per-sector results Capability to sweep/vary most of WITE32 system parameters Integrated graphical result display Capability to export all raw test results to a text file
Amplitude Asymmetry Test Differentiator Optimization Test Rise-and-fall Time (T50) Test Rolloff Test Saturation Asymmetry Test
The Write-Excited Sectored Amplitude (WESA) test package is a new WITE32 external module. The module implements a set of tests that analyze different physical aspects of how a write operation can affect a subsequent read operation.
The BER Module is designed to provide various tests based on Bit Error Rate (BER) measurement using PRML channel.
D5000 Signal Analyzer Software allows for performing spectrum analysis much faster and in a wider frequency range comparing to standard SA-960 spectrum analyzer of RWA-2000 series.
The Media-Scanning Package (MSCAN) detects a variety of defects on media. It also provides a software environment to develop new media-scanning and defect-reporting modules. Such modules can be created for PRML Channel, Read-Write Analyzer (RWA), or custom-designed hardware.
Thermal Asperity and Extra Pulse detection on erased track Multi-threshold amplitude analysis of positive and negative signal peaks 10 detectors can run in parallel with different settings/thresholds Digital low-pass filtering with programmable cut-off frequency High 15-bit resolution of detection thresholds
Transition time shift (bit shift) and amplitude analysis Various defect detectors for simultaneous analysis of bit shift, missing pulses, super pulses, and thermal asperities Multi-threshold amplitude analysis at positive and negative signal peaks 24 detectors can run in parallel with different settings/thresholds Time shift (bit shift) analysis by zero-crossing detection for perpendicular recording High sampling
Build 3D and 2D Plots of Individual Magnetic Transitions Along-the-track Sampling Period 0.1ns (2nm at 7200RPM, MD location)* Cross-track Accuracy 0.4nm (1 s) with Guzik Servo** Non-destructive Measurements Scan Time less than 20 Seconds for 10mm ´ 10mm Area with 12 nm Step Compatible with Perpendicular and Longitudinal Products ________________ * All specifications are subject to change.
Micro Actuator is a device located on the suspension of a magnetic head
that can transform applied voltage to radial displacement of the head.
Faster Test Execution Less Number of Retry Operations More Successfully Written Sectors TAA Measurement SNR Measurement BER Measurement
Multiple Side Tracks Configurable by User TAA Measurements SpiSNR Measurements
The new mode of Guzik Test System operation allows for performing tests approximately 20–30% faster. This is an optional purchase component of WITE32, which requires a license.
Guzik V2002 spinstand is created for testing Head Gimbal Assemblies (HGA), Head Stack Assemblies (HSA), Head Arm Assemblies (HAA), as well as for the media testing.
The Guzik DTR Test System belongs to a new generation of Guzik test systems designed for R&D and Production of the Discrete Track Recording components.
Guzik DTR 3000 spinstand is created for testing Head Gimbal Assemblies (HGA), Head Stack Assemblies (HSA), Head Arm Assemblies (HAA), as well as for the DTR and non-DTR media testing.
The Guzik S-1701MP Micro Positioning Spinstand is equipped with a patented² closed loop positioning system consisting of a piezo substage and precision optical scales with 0.04 µIn resolution.
Guzik S-1701A Micro Positioning Spinstand is dynamically improved2 over its predecessors 1701MP and 1701CF.
Guzik S-1701A+ Micro Positioning Spinstand achieves a better electrical and mechanical noise isolation compared to its predecessor S-1701A due to its separated control box and spinstand.
Guzik S-1701B Micro Positioning Spinstand achieves better electrical and mechanical noise isolation compared to its predecessors S-1701A and S-1701A+ due to its separated control box and spinstand and air shock absorbers, installed inside the spinstand frame.
Better Test Results Repeatability on Different Spinstands Up to Three Times Better Spinstand Positioning Accuracy Up to Two Times Better Accuracy of W/R Offset Measurements
Micro Positioning system delivers 1 µInch positioning repeatability. Linear Simulation of Rotary Skew configurable from -7 to +22 degrees. Available factory upgrade from standard S-312 to S-312MP. Builds on recognized Guzik S-312 reliability, durability, installed base and industry experience.